In addition, with the increase of deposited time from 2 to 6 s, the diffraction peaks for fcc-structured FeNi weaken, while those for bcc-structured FeNi strengthen. According to the deposition rate of V (about 0.25 nm/s) derived from the monolithic V film, the thicknesses of the V layers deposited for

2, 4, 6, 8, 10, and 12 s at the same condition are 0.5, 1.0, 1.5, 2.0, 2.5, and 3.0 nm, respectively, selleck products which have been indexed in the corresponding XRD patterns in Figure 2. When the V layer thickness increases from 1.5 to 2.0 nm, however, the bcc-structured FeNi can hardly be detected, implying that the martensitic transformation of FeNi terminates. As the V layer thickness further rises to 3.0 nm, the (110) diffraction peak of bcc-structured V emerges in the XRD patterns besides fcc-structured FeNi, suggesting that V layers begin to present a stable bcc structure. Figure 2 XRD patterns of the monolithic FeNi film and FeNi/V nanomultilayered films with different

V layer thicknesses. According to the investigation of nanomultilayered films, when two crystallized layers form a nanomultilayered film by alternate deposition, if the thickness www.selleckchem.com/products/AZD1152-HQPA.html of one layer is small enough, this layer will transform into the same structure with the other and grow epitaxially with the other, in order to lower the interfacial energy of the whole film system Rolziracetam [17], such as TiN/AlN [18], TiB2/VC [19], and ZrO2/TiN [20] nanomultilayered films. Under the epitaxial growth structure formed in the nanomultilayered films, the originally larger lattice parameter of one layer is inclined to decrease, leading to generation of interfacial compressive stress, while the originally smaller lattice parameter of the other layer is forced to increase, resulting in formation of interfacial tensile stress. In the

FeNi/V nanomultilayered films, due to the small thickness of V layers, the bcc-structured V layers can be forced to transform into a fcc structure and grow epitaxially with the FeNi layers. The lattice parameters for Fe50Ni50 and V, respectively, are 342 and 302 pm. Under the epitaxial growth structure, FeNi layers will bear the interfacial compressive stress. Therefore, it can be deduced that the martensitic transformation of FeNi layers can be induced by interfacial compressive stress within the FeNi/V nanomultilayered films. When the thickness of the V layer further increases to 2.0 nm, V layers cannot maintain the epitaxial growth with the FeNi layers, leading to disappearance of interfacial stress and termination of the martensitic transformation in the FeNi film. Nevertheless, the epitaxial growth structure and its induced martensitic transformation need to be further verified from HRTEM investigation.